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Home » Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope

  1. Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope

    Author Name: JianQiang Yu, JingHe Yuan, XueJie Zhang, JianLi Liu

    We have built an integrated imaging system by combining stimulated emission depletion (STED) microscope and atomic force microscope (AFM). The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of 42 nm was achieved. With this integrated imaging system, morphological features, mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples. This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.

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